Theoretical analysis of energy spectra of electrons reflected from the Nb/AlOx-Al/Nb structure |
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Spectra of electrons reflected from the ![]()
Theoretical interpretation
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The calculation of electron energy spectra reflected from heterogeneous in depths targets is based on formulas (7), (9), (10), (14).
Fig. 1. Reflected electrons spectra Solid line shows experimental data, dashed blue line – calculation for two-layer model. Varying the top Nb-layer thickness for target the Nb-layer thickness has been obtained that fits experimental data best (fitting-procedure). Nb-layer thickness: x=30 nm. Fig. 2. Reflected electrons spectra Solid line shows experimental data, dashed red line – calculation for multilayer model. Target has been represented as consisted of 4 layers. Niobium concentration profile recovered (fitting-procedure) from experimental spectrum is depicted on Fig.2.
Fig.3 Fitting-procedure The model as such together with all its parameters has been kept constant. Solid line – experiment data, dashed blue line – calculation. Fig.4 Fitting-procedure The model as such together with all its parameters has been kept constant. Solid line – experiment data, dashed red line – calculation. Accuracy of layer thickness measurements Fig. 5. Reflected electrons spectra Solid blue line – experiment data, dashed blue line – calculation, thin dashed line - experimental error range. Nb layer thickness x=30 nm is defined with error 1 nm.
Fig.6 Fitting-procedure Comparison of electron spectroscopy and Transmission electron microscopy results
Fig.7
Cross-section of Nb/Al-AlOx/Nb SIS junction Fig.7 shows typical image of cross-section of Nb/AlOx-Al/Nb tunnel structure got by TEM. Electron spectroscopy conclusion about sharp Al-AlOx/Nb interface and diffused Nb/Al one is consistent with TEM results. |