Theoretical analysis of energy spectra of electrons reflected from the  Nb/AlOx-Al/Nb structure

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Consistent solution of elastic and inelastic problems

The calculation of electron energy spectra reflected from heterogeneous in depths targets is based on formulas (7), (9), (10), (14).

Nb/AlOx-Al

Fig. 1. Reflected electrons spectra

Solid line shows experimental data, dashed blue line – calculation for two-layer model. Varying the top Nb-layer thickness for target the Nb-layer thickness has been obtained that fits experimental data best (fitting-procedure). Nb-layer thickness: x=30 nm.

Nb/Al

Fig. 2. Reflected electrons spectra

Solid line shows experimental data, dashed red line – calculation for multilayer model. Target has been represented as consisted of 4 layers. Niobium concentration profile recovered (fitting-procedure) from experimental spectrum is depicted on Fig.2.

Fitting

Nb/AlOx-Al

Fig.3 Fitting-procedure

The model as such together with all its parameters has been kept constant. Solid line – experiment data, dashed blue line – calculation.

Nb/Al

Fig.4 Fitting-procedure

The model as such together with all its parameters has been kept constant. Solid line – experiment data, dashed red line – calculation.

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Accuracy of layer thickness measurements

Fig. 5. Reflected electrons spectra

Solid blue line – experiment data, dashed blue line – calculation, thin dashed line - experimental error range. Nb layer thickness x=30 nm is defined with error 1 nm.

Fig.6 Fitting-procedure

Comparison of electron spectroscopy and Transmission electron microscopy results

Fig.7 Cross-section of Nb/Al-AlOx/Nb SIS junction
(
T. Imamura, S. Hasuo. IEEE Trans. Magnetics, 1991, v.27(2), p.3172-3175)

Fig.7 shows typical image of cross-section of Nb/AlOx-Al/Nb tunnel structure got by TEM. Electron spectroscopy conclusion about sharp Al-AlOx/Nb interface and diffused Nb/Al one is consistent with TEM results.

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