SPIM-L is software for Monte-Carlo simulation of electron and ion transfer in solid, liquid or gas targets, as well as radiation transfer in turbid media. SPIM-L employs the classical method for calculation of probabilistic trajectories of particles based on the individual collisions model.

Features

• Statistical sampling of scattering angle and energy losses uses either real or artificial differential scattering cross sections.

• Correct statistical sampling of chance variable with anisotropic probability density, taking into account specifics of computer’s pseudo-random number generator.

• Statistical analysis of the following parameters: number of elastic scattering events along particle’s full trajectory; number of events of inward/outward direction change; number of events of scattering to the angle exceeding specified value.

• For simulation of electron scattering, one can use Rutherford or Riley-MacCallum-Biggs cross section. For scattering of ions: cross sections are calculated on the base of ZBL or Kr‑C potentials. For modelling of radiation transfer, artificial Heyney-Greenstein phase function is used.

• Particle energy losses are calculated on the base of one of the following models: continuous slowing down, single albedo, Liljequist approximation or with the use of real differential inelastic scattering cross section.

• Different type of targets can be taken for modelling: homogenous, heterogeneous, single-layer or multi-layer targets. Surface topography also can be taken into account.

Output data

• Scattering angle, energy losses, path length distributions – for particles reflected from or penetrated through the target.

• Double-differential scattering angle, energy losses distributions – for particles reflected from or penetrated through the target.

• Reflection or transmission coefficient.

• Trajectory of particles in target.

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On-line version of the software is coming. Meanwhile, the calculations are available off-line for free, by submitting the form below.

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Text of request:

Initial energy of electrons  (from 100 eV to 300 keV): Target layers (thicknesses,  elements, concentrations): Requested spectrum parameters: Additional notes:

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